KLA | Leaders in Process Control & Yield Management
3D Optical Profilometer Solutions for Solar Device Manufacturing Solar Cell Texture Busbars and Finger Lines
Solar Cell Texture
To reduce reflection and maximize light absorption, the cell surface is textured and a thin anti-reflective coating (ARC) layer is applied, after which silver busbar and finger lines are printed onto the wafer to provide electrical contact.
Solar Cell Texture
Problem: The performance of the solar cell is degraded due to nonuniform texture and out-of-spec surface roughness.
Solution: The KLA Instruments™ Zeta™-20 3D optical profiler quickly and easily measures 3D surface roughness and provides a topographic measurement of the textured surface. Texture may be quantified by various area and volume parameters, including 3D roughness, and the same measurement produces detailed visuals of the structure itself.
Busbars and Finger Lines
Problem: Busbar and finger line dimensional characterization are critical to ensure uniform conductivity of the DC current generated by the solar cells.
Solution: The Zeta-20 3D optical microscope simultaneously measures line width, height and structural uniformity of finger and bus lines, which are important metrics in solar cell manufacturing due to the impact on cell performance. The Zeta-20 delivers the capability to measure both high reflectivity (lines) and low reflectivity (texture) surfaces in a single field of view.
Contact us today to learn how the Zeta-20 3D optical profilometer can improve solar cell device yield by quickly and easily providing critical data on both surface texture and line dimensions.
In addition to 3D optical microscope systems for solar device manufacturing, KLA Instruments™ offers a portfolio of fab and lab tools including stylus and optical profilers, thin film reflectometers, sheet resistance mappers, nanoindenters and defect inspection systems.
Last year we invested 15% of sales back into R&D, exceeding industry standards. That’s a measure of our commitment to solving the most daunting technical challenges. From our ground-breaking mask inspection tool in 1975 that signaled the dawn of semiconductor process control, to today’s broadband plasma technology that discovers defects at the speed of light, we like to arrive first.
Active collaboration multiplies agile thinking. We put this approach into practice at strategic, technical and operational levels with our partners. Working side-by-side both geographically and intellectually, we maximize discovery and solutions.
We have a proven ability to go from concept to global marketplace. We invent in-house, make strategic acquisitions and share technology across systems to diversify our perspectives and widen the range of our solutions. Comprehensive service programs keep it all optimized.
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